发明名称 |
Burn-in apparatus having average voltage calculating circuit |
摘要 |
A function test circuit inside a burn-in apparatus is mounted on a burn-in board and specifies a plurality of checked devices which operate normally. An average voltage calculating circuit calculates average voltage for test voltage applied to a plurality of checked devices specified on a mounting section. A voltage correction circuit receives the average voltage and outputs a control signal to control set voltage output from a device power supply generation circuit. Therefore, this burn-in apparatus can set the test voltage applied to the checked devices readily with high accuracy.
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申请公布号 |
US2003062918(A1) |
申请公布日期 |
2003.04.03 |
申请号 |
US20020225306 |
申请日期 |
2002.08.22 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
HASHIMOTO OSAMU |
分类号 |
G01R31/26;G01R19/00;G01R31/28;G01R31/30;G01R31/3183;(IPC1-7):G01R31/26;G01R31/02 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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