发明名称 Burn-in apparatus having average voltage calculating circuit
摘要 A function test circuit inside a burn-in apparatus is mounted on a burn-in board and specifies a plurality of checked devices which operate normally. An average voltage calculating circuit calculates average voltage for test voltage applied to a plurality of checked devices specified on a mounting section. A voltage correction circuit receives the average voltage and outputs a control signal to control set voltage output from a device power supply generation circuit. Therefore, this burn-in apparatus can set the test voltage applied to the checked devices readily with high accuracy.
申请公布号 US2003062918(A1) 申请公布日期 2003.04.03
申请号 US20020225306 申请日期 2002.08.22
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HASHIMOTO OSAMU
分类号 G01R31/26;G01R19/00;G01R31/28;G01R31/30;G01R31/3183;(IPC1-7):G01R31/26;G01R31/02 主分类号 G01R31/26
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