发明名称 METHOD OF MANUFACTURING COMPOUND SEMICONDUCTOR WAFER
摘要 <p>Compound-semiconductor-wafer manufacturing whereby particle adherence, and obverse-surface oxidization and alteration are slight and the use of organic solvents is reduced. An adsorption pad is bonded to a polishing plate, and a wafer being adsorbed onto the adsorption pad without using wax is polished and thereafter stored within purified water without drying. Since storage is within purified water, particle adherence, and obverse-surface oxidization and alteration turn out to be slight, yielding a high-quality wafer. In the cleaning procedure following the aquatic storage, organic solvent washing is omitted. This allows the use/waste volume of noxious organic solvent to be reduced. &lt;IMAGE&gt;</p>
申请公布号 EP1298714(A1) 申请公布日期 2003.04.02
申请号 EP20020701687 申请日期 2002.03.01
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 OKAMOTO, TAKATOSHI;MEZAKI, YOSHIO;MORIMOTO, TOSHIYUKI
分类号 H01L21/304;H01L21/302;H01L21/306;(IPC1-7):H01L21/304 主分类号 H01L21/304
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