发明名称 |
METHOD OF MANUFACTURING COMPOUND SEMICONDUCTOR WAFER |
摘要 |
<p>Compound-semiconductor-wafer manufacturing whereby particle adherence, and obverse-surface oxidization and alteration are slight and the use of organic solvents is reduced. An adsorption pad is bonded to a polishing plate, and a wafer being adsorbed onto the adsorption pad without using wax is polished and thereafter stored within purified water without drying. Since storage is within purified water, particle adherence, and obverse-surface oxidization and alteration turn out to be slight, yielding a high-quality wafer. In the cleaning procedure following the aquatic storage, organic solvent washing is omitted. This allows the use/waste volume of noxious organic solvent to be reduced. <IMAGE></p> |
申请公布号 |
EP1298714(A1) |
申请公布日期 |
2003.04.02 |
申请号 |
EP20020701687 |
申请日期 |
2002.03.01 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
OKAMOTO, TAKATOSHI;MEZAKI, YOSHIO;MORIMOTO, TOSHIYUKI |
分类号 |
H01L21/304;H01L21/302;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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