发明名称 |
Chemical mechanical polishing apparatus and method having a rotating retaining ring |
摘要 |
A polishing apparatus (100) and method for polishing and planarizing a substrate (105) is provided that achieves a high-planarization uniformity across the substrate. In one embodiment, the polishing head (140) includes a carrier (155), a subcarrier (160) carried by the carrier and adapted to hold the substrate (105) during a polishing operation and a retaining ring (170) rotatably disposed about the subcarrier. The retaining ring (170) has a lower surface (205) that is substantially flush with the surface of the substrate (105) and is in contact with a polishing surface (125) during the polishing operation. The retaining ring (170) is capable of rotating relative to the substrate (105) held on the subcarrier (160) to inhibit non-planar polishing of the surface of the substrate. In another embodiment, the polishing head (140) further includes a backing ring (210) in a facing relationship with an upper surface (255) of the retaining ring (170) and separated from the retaining ring by a bearing (260).
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申请公布号 |
US6540590(B1) |
申请公布日期 |
2003.04.01 |
申请号 |
US20000652854 |
申请日期 |
2000.08.31 |
申请人 |
MULTI-PLANAR TECHNOLOGIES, INC. |
发明人 |
KAJIWARA JIRO;WANG HUEY-MING |
分类号 |
B24B37/04;B24B41/06;B24B57/02;B24D13/14;(IPC1-7):B24B1/00 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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