发明名称 RUN-TO-RUN CONTROL METHOD FOR PROPORTIONAL-INTEGRAL-DERIVATIVE (PID) CONTROLLER TUNING FOR RAPID THERMAL PROCESSING (RTP)
摘要 A method is provided, the method comprising measuring at least one parameter characteristic of rapid thermal processing performed on a workpiece in a rapid thermal processing step, and modeling the at least one characteristic parameter measured using a first-principles radiation model. The method also comprises applying the first-principles radiation model to modify the rapid thermal processing performed in the rapid thermal processing step.
申请公布号 WO02067297(A3) 申请公布日期 2003.03.27
申请号 WO2001US43415 申请日期 2001.11.06
申请人 ADVANCED MICRO DEVICES, INC. 发明人 RILEY, TERRENCE, J.;CAMPBELL, WILLIAM, JARRETT
分类号 G05B11/42;G05B13/04 主分类号 G05B11/42
代理机构 代理人
主权项
地址