发明名称 Deposition chamber and method for depositing low dielectric constant films
摘要 An improved deposition chamber (2) includes a housing (4) defining a chamber (18) which houses a substrate support (14). A mixture of oxygen and SiF4 is delivered through a set of first nozzles (34) and silane is delivered through a set of second nozzles (34a) into the chamber around the periphery (40) of the substrate support. Silane (or a mixture of silane and SiF4) and oxygen are separately injected into the chamber generally centrally above the substrate from orifices (64, 76). The uniform dispersal of the gases coupled with the use of optimal flow rates for each gas results in uniformly low (under 3.4) dielectric constant across the film.
申请公布号 US2003056900(A1) 申请公布日期 2003.03.27
申请号 US20020283565 申请日期 2002.10.29
申请人 APPLIED MATERIALS, INCORPORATED A DELAWARE CORPORATION 发明人 LI SHIJIAN;WANG YAXIN;REDEKER FRED C.;ISHIKAWA TETSUYA;COLLINS ALAN W.
分类号 C23C16/44;C23C14/34;C23C16/40;C23C16/455;H01L21/205;H01L21/31;(IPC1-7):C23F1/00;C23C16/00;H05H1/24 主分类号 C23C16/44
代理机构 代理人
主权项
地址