发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To increase the operating speed of a MOS transistor. SOLUTION: A semiconductor device is provided which comprises a source region formed of a semiconductor, a drain region formed of a semiconductor having the same conductivity type as that of the source region, a channel region (202) formed of a semiconductor between the source region and the drain region, a gate insulation film (201) formed on the channel region, and a gate electrode which is formed on the gate insulation film and has a PN junction which is formed by a P-type semiconductor region (104b) and N-type semiconductor regions (104a, 302). The P-type semiconductor region and the N-type semiconductor regions of the PN junction (106) of the gate electrode are electrically insulated from each other.
申请公布号 JP2003086810(A) 申请公布日期 2003.03.20
申请号 JP20010275538 申请日期 2001.09.11
申请人 FUJITSU LTD 发明人 NIKAMI TAKASHI
分类号 H01L29/43;H01L21/336;H01L21/337;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L29/43
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