METHODS AND APPARATUS FOR TESTING ELECTRONIC CIRCUITS

摘要

Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits 737, devices 500, and systems such as digital integrated circuits 600, SRAM memory 606, mixed signal circuits 602, and the like. In particular, methods and apparatus are provided for detecting faults in circuits 737, devices 500, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test 712, where said transient power supply currents are of controllable bandwidth 702, 706 and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses 700-703. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents. The sensed transient supply currents can be compared to single or multiple thresholds to assess normal or faulty or defective operation of the device under test 712.