发明名称 DEVICE AND METHOD FOR PROCESSING SUBSTRATE
摘要 A substrate processing apparatus consists of: a processing container; a first processing gas supply unit and a second processing gas supply unit, countering each other, prepared on both sides of a substrate-to-be-processed to the processing container; and a first slit-shaped exhaust opening and a second slit-shaped exhaust opening provided one on each side of the substrate-to-be-processed approximately perpendicular to the flow of the first processing gas and the second processing gas, countering the first processing gas supply unit and the second processing gas supply unit, respectively. The first processing gas is passed along the surface of the substrate-to-be-processed from the first processing gas supply unit to the first exhaust opening, and is adsorbed by the surface of the substrate-to-be-processed. Then, the second processing gas is passed along the surface of the substrate-to-be-processed from the second processing gas supply unit to the second exhaust opening, the second processing gas reacts with molecules of the first processing gas previously adsorbed, and a high dielectric film of a single-molecule layer is formed. <IMAGE>
申请公布号 KR20030023750(A) 申请公布日期 2003.03.19
申请号 KR20037002013 申请日期 2003.02.11
申请人 发明人
分类号 H01L21/205;C23C16/40;C23C16/44;C23C16/455;H01L21/31 主分类号 H01L21/205
代理机构 代理人
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