发明名称 RING-SHAPED HIGH-DENSITY PLASMA SOURCE AND METHOD
摘要 A processing system for processing a substrate with a plasma is provided with an antenna for producing a ring-shaped inductively coupled plasma in a vacuum processing chamber particularly useful for coating or etching semiconductor wafer substrates. A three-dimensional antenna in the form of a coil provides spacial distribution of plasma parameters in a ring-shaped region inside of the chamber that can be adapted to specific physical and process requirements. An axially symmetric permanent magnet assembly enhances the ring-shaped concentration of a high-density inductively coupled plasma by trapping the plasma in the ring-shaped region near the inside of a dielectric window located in the chamber wall in close proximity to segments of the antenna that lie adjacent the outside of the window.
申请公布号 KR20030022334(A) 申请公布日期 2003.03.15
申请号 KR20037001336 申请日期 2003.01.29
申请人 发明人
分类号 H01L21/3065;H05H1/46;C23C14/34;C23C16/509;H01J37/32;H01J37/34;H01L21/205 主分类号 H01L21/3065
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