发明名称 |
RING-SHAPED HIGH-DENSITY PLASMA SOURCE AND METHOD |
摘要 |
A processing system for processing a substrate with a plasma is provided with an antenna for producing a ring-shaped inductively coupled plasma in a vacuum processing chamber particularly useful for coating or etching semiconductor wafer substrates. A three-dimensional antenna in the form of a coil provides spacial distribution of plasma parameters in a ring-shaped region inside of the chamber that can be adapted to specific physical and process requirements. An axially symmetric permanent magnet assembly enhances the ring-shaped concentration of a high-density inductively coupled plasma by trapping the plasma in the ring-shaped region near the inside of a dielectric window located in the chamber wall in close proximity to segments of the antenna that lie adjacent the outside of the window.
|
申请公布号 |
KR20030022334(A) |
申请公布日期 |
2003.03.15 |
申请号 |
KR20037001336 |
申请日期 |
2003.01.29 |
申请人 |
|
发明人 |
|
分类号 |
H01L21/3065;H05H1/46;C23C14/34;C23C16/509;H01J37/32;H01J37/34;H01L21/205 |
主分类号 |
H01L21/3065 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|