发明名称 |
PLASMA ETCHING DEVICE AND PLASMA ETCHING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma etching device and a plasma etching method for efficiently and inexpensively performing uniform etching work. SOLUTION: In a plasma etching method, a substrate to be processed 7 is placed on a lower electrode 3 disposed so that it faces an upper electrode 6 in a processing chamber 5, and plasma etching is performed. Mix gas including oxygen and fluorine gases is supplied into the processing chamber 5. Plasma discharge is performed between the upper and lower electrodes under a condition that the product PL of an inter-electrode distance L [m] and the discharge pressure P [Pa] of mix gas in the processing chamber 5 becomes the value of the range of 2.5 [Pa.m] to 15 [Pa.m], which is a range giving a satisfactory etching rate. Thus, inexpensive and highly efficient plasma etching is performed.
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申请公布号 |
JP2003077892(A) |
申请公布日期 |
2003.03.14 |
申请号 |
JP20020225785 |
申请日期 |
2002.08.02 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ARITA KIYOSHI;HAJI HIROSHI |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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主权项 |
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地址 |
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