发明名称 RF-ID INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To prevent the occurrence of misinspection and the outflow of defective products by surely specifying a piece to be inspected in an RF-ID inspection system for inspecting the quality of produced RF-ID. SOLUTION: A shield member 13 is inserted between a target inspection piece 21X for one RF-ID 21 formed on a sheet 12 and a system side antenna 14 for communication, the antenna 14 is opposed from an aperture part 22 formed on the shield member 13 to the inspection piece 21X, information is transmitted from the antenna 14 to the piece 21X, and the quality of the piece 21X is judged in accordance with a response to the transmitted information.
申请公布号 JP2003076947(A) 申请公布日期 2003.03.14
申请号 JP20010269561 申请日期 2001.09.05
申请人 TOPPAN FORMS CO LTD 发明人 SAITO MITSUGI;HAYASHI TAKAYUKI
分类号 G06K19/07;G06K17/00 主分类号 G06K19/07
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