发明名称 RF-ID INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To prevent the occurrence of misinspection and the outflow of defective products by surely specifying a piece to be inspected in an RF-ID inspection system for inspecting the quality of produced RF-ID. SOLUTION: RF-ID antennas 21B arranged on the periphery of a target inspection piece 21X for one RF-ID 21 formed on a sheet 12 are short-circuited by a short circuit member 13, a system side antenna 14 is opposed to the piece 21X to transmit information from the antenna 14 to the piece 21X and judge whether the piece 21X is good or not in accordance with a response.
申请公布号 JP2003076946(A) 申请公布日期 2003.03.14
申请号 JP20010269560 申请日期 2001.09.05
申请人 TOPPAN FORMS CO LTD 发明人 SAITO MITSUGI;HAYASHI TAKAYUKI
分类号 G06K19/07;G06K5/00;G06K17/00;G06K19/077;H01Q23/00 主分类号 G06K19/07
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