| 摘要 |
PROBLEM TO BE SOLVED: To reduce measurement variance caused by tip variation, and to improve yield. SOLUTION: In a magnetic head inspecting device 10 for inspecting a magnetic head 11, an amplitude modulated current modulated in amplitude by a predetermined carrier wave frequency and a modulation frequency is applied to the magnetic head 11. A correction magnetic field generation source 14 generates a magnetic field of fixed intensity and frequency for the magnetic head 11 to correct measurement variance of the magnetic head 11. A magnetic head measuring device 12 measures a high-frequency magnetic field generated in the magnetic head 11. Additionally, when necessary, by using a replacement magnetic body probe 13, a probe in the magnetic head measuring device 12 is replaced by the probe 13.
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