发明名称 STENCIL MASK
摘要 <p>PROBLEM TO BE SOLVED: To provide a stencil mask which has high durability and hardly deforms or damages a mask pattern. SOLUTION: The stencil mask is composed of a first stencil mask 38 having a first linear pattern 32 divided from an L-shaped pattern 22 as a mask pattern and a second stencil mask 40 having a second linear pattern 36 that is the remain of the pattern 22, as a mask pattern. At exposure, the first mask 38 is used for exposure, and then the second mask 40 is used for exposure, thereby transferring the L-shaped pattern 22 onto a wafer W.</p>
申请公布号 JP2003077818(A) 申请公布日期 2003.03.14
申请号 JP20010269050 申请日期 2001.09.05
申请人 SONY CORP 发明人 ONUMA EIJU
分类号 G03F1/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/20
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