A CVD chamber−use plasma cleaning gas which is used to clean silicon−containing deposits accumulated on the inner−wall surface of a CVD chamber and on the surfaces of members disposed in the CVD chamber after a film is formed on a substrate by a plasma CVD device,characterized in that the cleaning gas is a 100 vol.% of fluorine gas that generates plasma by discharging.When plasma generated by discharging from a 100 vol.% in concentration of fluorine gas is used as a cleaning gas,a very excellent etching speed is available,plasma can be generated constantly even at a total gas flow rate of 1000 sccm and under a chamber pressure of 400 Pa,and a uniform cleaning can be ensured under the above conditions.The 100% concentration does not complicate the device to provide an excellent practical use.
申请公布号
WO03021653(A1)
申请公布日期
2003.03.13
申请号
WO2002JP08566
申请日期
2002.08.26
申请人
RESEARCH INSTITUTE OF INNOVATIVE TECHNOLOGY FOR THE EARTH;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE;SEKIYA, AKIRA;MITSUI, YUKI;OHIRA, YUTAKA;YONEMURA, TAISUKE