发明名称 PLASMA CLEANING GAS AND PLASMA CLEANING METHOD
摘要 A CVD chamber−use plasma cleaning gas which is used to clean silicon−containing deposits accumulated on the inner−wall surface of a CVD chamber and on the surfaces of members disposed in the CVD chamber after a film is formed on a substrate by a plasma CVD device,characterized in that the cleaning gas is a 100 vol.% of fluorine gas that generates plasma by discharging.When plasma generated by discharging from a 100 vol.% in concentration of fluorine gas is used as a cleaning gas,a very excellent etching speed is available,plasma can be generated constantly even at a total gas flow rate of 1000 sccm and under a chamber pressure of 400 Pa,and a uniform cleaning can be ensured under the above conditions.The 100% concentration does not complicate the device to provide an excellent practical use.
申请公布号 WO03021653(A1) 申请公布日期 2003.03.13
申请号 WO2002JP08566 申请日期 2002.08.26
申请人 RESEARCH INSTITUTE OF INNOVATIVE TECHNOLOGY FOR THE EARTH;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE;SEKIYA, AKIRA;MITSUI, YUKI;OHIRA, YUTAKA;YONEMURA, TAISUKE 发明人 SEKIYA, AKIRA;MITSUI, YUKI;OHIRA, YUTAKA;YONEMURA, TAISUKE
分类号 B08B7/00;C23C16/44;H01L21/3065;(IPC1-7):H01L21/31;H01L21/306 主分类号 B08B7/00
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