发明名称 Exposure system of semiconductor wafer and method for operating the same
摘要 An exposure system of a semiconductor wafer and a method for operating the same capable of preventing defects in a photolithographic process. The exposure system of a semiconductor wafer comprises first and second shutters for opening or closing a light source, first and second sensing circuits for sensing the positions of the first and second shutters to generate first and second sensed signals, a controller for determining whether the first and second shutters are completely opened in response to the first and second sensed signals and for generating a control signal when the first and second shutters are not completely opened.
申请公布号 US2003048429(A1) 申请公布日期 2003.03.13
申请号 US20020158501 申请日期 2002.05.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JIN-MUK
分类号 G03F7/20;(IPC1-7):G03B27/42 主分类号 G03F7/20
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