发明名称 |
Exposure system of semiconductor wafer and method for operating the same |
摘要 |
An exposure system of a semiconductor wafer and a method for operating the same capable of preventing defects in a photolithographic process. The exposure system of a semiconductor wafer comprises first and second shutters for opening or closing a light source, first and second sensing circuits for sensing the positions of the first and second shutters to generate first and second sensed signals, a controller for determining whether the first and second shutters are completely opened in response to the first and second sensed signals and for generating a control signal when the first and second shutters are not completely opened.
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申请公布号 |
US2003048429(A1) |
申请公布日期 |
2003.03.13 |
申请号 |
US20020158501 |
申请日期 |
2002.05.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM JIN-MUK |
分类号 |
G03F7/20;(IPC1-7):G03B27/42 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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