发明名称 Process for the wet-chemical surface treatment of a semiconductor wafer
摘要 A process for the wet-chemical surface treatment of a semiconductor wafer following a mechanical surface treatment, in particular following a mechanical surface treatment in a lapping machine, includes a sequence of treatment steps. The process essentially includes a wet-chemical surface cleaning, preferably for neutralizing and eliminating the lapping slurry, an acid etching treatment, preferably for eliminating the mechanically imposed damage and for surface smoothing and removal of metals. There is a final step of drying and rendering the cleaned and etched surface hydrophilic.
申请公布号 US6530381(B1) 申请公布日期 2003.03.11
申请号 US20000704315 申请日期 2000.11.02
申请人 WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG 发明人 SCHWAB GUENTER;LANGSDORF KARLHEINZ;STADLER MAXIMILIAN;PICHELMEIER EDELTRAUT
分类号 C30B33/00;H01L21/304;H01L21/306;(IPC1-7):C25F5/00 主分类号 C30B33/00
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