| 摘要 |
A pulse generation circuit which can be controlled to generate on-signals and off-signals simultaneously for use in testing the protection circuit of a power device's drive circuitry. The protection circuit prevents faulty operation due to dv/dt transient signals which can cause the S and R input signals to a set-reset flip-flop circuit to simultaneously be HI, resulting in an error condition. Protection circuit 26a has the structure as shown in FIG. 1. A pulse generation circuit, as shown in FIG. 3, can be used to provide simultaneous changes of logic value at B and C to test the protection circuit.
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