Test device for electronic circuits has mounting frames and rails for the positioning of a circuit under test and test electrodes such that the latter can be freely positioned and then clamped in position for subsequent testing

摘要

Device for holding and testing electronic assemblies comprises upper (1) and lower (12) rigid frames (1, 12). The upper frame is connected to the lower frame so that it pivots about a linkage (11). The upper frame supports two clamping rails that can be displaced and clamped in position. A circuit under test (3) is held in grooves within the clamping rails. The clamping rails have freely positionable test needle electrodes (4) that can be used to test the upper or lower surfaces of the circuit under test.