Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same

摘要

An inspection terminal for accurately measuring a characteristic of an electronic chip component without causing an inner electrode layer constituting an external electrode of the electronic chip component to be exposed to the outside, an inspection method, and an inspection apparatus using the same, involves storing an electronic chip component in a storing portion of a turntable and sucking the electronic chip component by a sucking portion provided in a side guard. A linear edge portion of the inspection terminal is pressed from the bottom so as to abut against the external electrode of the electronic chip component. The linear edge portion is arranged to have an obtuse angle and is brought into contact with the external electrode such that the edge portion lies substantially parallel to the longitudinal direction of the external electrode.