发明名称 INSPECTING APPARATUS AND INSPECTING METHOD FOR ILLUMINATING OPTICAL ELEMENT
摘要 PURPOSE: To provide an inspecting apparatus and an inspecting method for an illuminating optical element which efficiently inspect the illuminating optical element and reduce a manufacturing cost. CONSTITUTION: The inspecting apparatus 2 for lens arrays is provided with a light source apparatus 320 for radiating a parallel light flux, lens array holders 312, 313 for holding the lens arrays 113, 115 as subjects for separating the parallel light flex into a plurality of partial light flexes, and a frosted glass 170 for projecting optical images of the flexes radiated through the lens arrays 113, 115. A discarding frame corresponding to an illuminating region in design is formed on the frosted glass 170. The quality of the lens arrays 113, 115 is determined by existence of the region of the discarding frame included by the optical images projected on the frosted glass 170.
申请公布号 KR20030019166(A) 申请公布日期 2003.03.06
申请号 KR20020051052 申请日期 2002.08.28
申请人 SEIKO EPSON CORPORATION 发明人 KITABAYASHI MASASHI
分类号 G01N21/00;G01N21/958;G02B27/14;(IPC1-7):G01N21/00 主分类号 G01N21/00
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