发明名称 INSPECTION APPARATUS FOR LIQUID CRYSTAL PANEL AND INSPECTION METHOD FOR LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus for a liquid crystal panel which is capable of easily inspecting whether an electrode 110 of the liquid crystal panel 100 is shorted or disconnected at a low cost without using a CCD camera, etc. SOLUTION: The width of a contact region 12 of a probe terminal 1 for inspection is smaller than the width of the electrode 110 of the liquid crystal panel 100 and the width of an extendedly existing region 11 and a non-contact region 13 is greater than the width of the contact region 12. The extendedly existing region 11 and the non-contact region 13 are covered by an insulator 14. The apparatus has a pressing section 15 to press the contact region 12 so as to come into contact with the electrode 110. The apparatus has the width of the contact region 12 of the probe terminal 1 and a spacing of the magnitude of 1.5 to 2 times that.
申请公布号 JP2003066399(A) 申请公布日期 2003.03.05
申请号 JP20010258213 申请日期 2001.08.28
申请人 SEIKO EPSON CORP 发明人 TANAKA SHIGEKAZU
分类号 G01R1/073;G01R31/02;G01R31/28;G02F1/13;G09F9/00;G09F9/35;(IPC1-7):G02F1/13 主分类号 G01R1/073
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