| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing method and testing device of precisely and efficiently performing a test even to a board having patterns aligned with high density, and a manufacturing method of electro-optical device. SOLUTION: The model of an original board having a conductor pattern to be tested is selected, and model data according to the pattern mode is read. The attitude of the original board is corrected, and two or more electrode pattern parts on the original board are set in a prescribed attitude. Thereafter, the alignment of a proper electrode pattern part with the probe head 12 of the testing device is executed, and alignment information is obtained. By use of the alignment information, a testing position is derived on the basis of the alignment information of the electrode pattern included in the model data. According to the derived testing position, the test of each electrode pattern part is executed.
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