| 摘要 |
PROBLEM TO BE SOLVED: To efficiently set a bias to a test target. SOLUTION: While a constant voltage (signal level) A0 is being inputted from a signal generation section 3 to a test target 2, a bias voltage B applied to the test target 2 is adjusted and an output voltage (signal level) D to be tested is controlled to a specific target range before testing the test target 2 by the testing apparatus 11. Then, the testing apparatus 11 comprises an achievement value memory 22 for storing an average setting value Bm of each bias voltage set to each test target that has been tested and average inclination Km of each inclination, and setting voltage determination means 15, 16, and 17 for obtaining the setting voltage of a bias voltage to be applied to the test target using the average inclination and average setting value stored at the achievement value memory and an output voltage when the average setting value is applied to the test target and the center value of a target range according to a bias voltage adjustment command.
|
