发明名称 SEMICONDUCTOR DEVICE LOADING DEVICE FOR TEST HANDLER
摘要 PROBLEM TO BE SOLVED: To provide a device loading device for a test handler. SOLUTION: The device loading device is provided with a body part 60 and a guide block fixing plate 70 installed separately from the body part and guiding devices 109 attached to a vacuum sucker so that they are accurately placed safely in each pocket of a test tray. The guide block fixing plate 70 is separated a predetermined interval below the vacuum sucker and separately arranged a predetermined interval above the test tray 110. Each guide block is provided with an open hole 72 opened in a vertical direction, and guide pins 73 extended downward from both longitudinal sides of the open hole. The open hole 72 comprises an inlet part 72a formed slightly larger than a size of the device, an outlet part 72b formed in a size substantially the same as the size of the device, and a guide part 72c formed obliquely so that a diameter becomes smaller toward the outlet part between the inlet part and the outlet part.
申请公布号 JP2003066094(A) 申请公布日期 2003.03.05
申请号 JP20010307935 申请日期 2001.10.03
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JUNG BYUNG-GI
分类号 G01R31/26;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/26
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