| 摘要 |
PROBLEM TO BE SOLVED: To provide a drive method of a solid-state imaging device, that can accurately detect the level of white flaws, depending on the temperature, even at a temperature of 40 deg.C or below and also accurately detect the dark current and defects or the like within a vertical shift register, with high accuracy. SOLUTION: The drive method of the solid-state imaging device, in which electric charges stored in a photodiode formed on a semiconductor substrate are transferred to the vertical shift register in a timing of read pulses, a vertical transfer pulse vertically transfers the vertical shift register, and the electric charges are outputted externally via a horizontal shift register and an amplifier, has a first period 301 where the electric charges in the photodiode are read by using a read pulse 311 and vertical transfer pulses 31 to 34; vertically transferred and externally outputted, a second period 302, where transfer of the electric charges present in the vertical shift register is stopped for three horizontal periods or longer, and a third period 303 where electric charges such as noise stored in the vertical shift register are discharged.
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