| 摘要 |
PROBLEM TO BE SOLVED: To obtain methods and apparatus for storing memory test information. SOLUTION: This method includes a step in which a portion of information related to locations and the number of defective memory cells detected while testing memory, and a step in which stored information is updated when a defective memory cell is detected, a first type memory spare is assigned to correct the defective memory cell, a second complementary type memory spare is assigned to correct the defective memory cell, also, it is indicated that the memory is not repairable. The first type memory spare corresponds to one of a row and a column portion of memory, the second complementary memory spare corresponds to the other of row and column portions of memory.
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