发明名称 IC SOCKET
摘要 PROBLEM TO BE SOLVED: To provide an IC socket keeping stable properties against repeated burn-in, having an electric contact with a durable plated layer. SOLUTION: The IC socket, for testing an IC having many electrodes, is mounted on a test device through a socket board. the IC socket has many electric contacts 20 which electrically connect the electrodes of the IC to a test device through an electric circuit formed to a socket board, and the electric contacts 20 have nickel palladium plating layer at a contact point 20a contacting the electrode of the IC.
申请公布号 JP2003059607(A) 申请公布日期 2003.02.28
申请号 JP20010247176 申请日期 2001.08.16
申请人 WELLS CTI KK 发明人 IKEDA SHUICHI
分类号 G01R31/26;G01R1/073;H01R13/03;H01R33/76;(IPC1-7):H01R33/76 主分类号 G01R31/26
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