发明名称 |
MULTIPLE EXPOSURE LITHOGRAPHY SYSTEM AND MECHANISM FOR PREVENTING DEFORMATION OF EXPOSURE REGION OF MULTIPLE EXPOSURE LITHOGRAPHY SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To form circuit patterns with high accuracy by preventing the deformation of exposure regions corresponding to respective modulating elements in forming the circuit patterns by using an exposure unit having a multiplicity of the modulating elements arranged in a matrix form. SOLUTION: The prescribed patterns are formed on a forming surface by multiple exposure using an exposure unit 2001 having a multiplicity of micromirrors M (m and n) arrayed in a matrix form. A shutter member 23 rotating in synchronization with the exposure operation of the micromirrors M (m and n) is disposed between the forming surface and a light source. A light transmission region 23A of the shutter member 23 crosses the optical path and guides the illumination light from the light source to the forming surface while the micromirrors M (m and n) are held static. A light shielding region 23B of the shutter member 23 crosses the optical path and shuts off the illumination light from the light source during the relative movement of the micoromirrors M (m and n). |
申请公布号 |
JP2003057833(A) |
申请公布日期 |
2003.02.28 |
申请号 |
JP20010243398 |
申请日期 |
2001.08.10 |
申请人 |
PENTAX CORP |
发明人 |
WASHIYAMA HIROYUKI |
分类号 |
G03F7/20;H01L21/027;H05K3/00;(IPC1-7):G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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