| 摘要 |
The invention provides a method for testing a memory unit (113) to be tested in a test device (100), the memory unit (113) to be tested being introduced into the test device (100), a first data register (102a-102N) to be tested being read out from the memory unit (113) to be tested and being tested in a comparator unit (106), and then at least one further data register (102a-102N) to be tested being read out of the memory unit (113) to be tested and tested in a comparator unit (106).
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