发明名称 Spherical aberration corrector for use in electron microscope, has rotation correcting lens positioned within focal plane of electron trajectory formed between axially symmetric lenses
摘要 <p>A pair of axially symmetric lenses (10',11') are placed between a pair of multipole elements (8',9'). A rotation correcting lens (12) placed in a focal plane of an electron trajectory formed between the axially symmetric lenses, acts to rotate electrons within a plane perpendicular to an optical axis.</p>
申请公布号 DE10231426(A1) 申请公布日期 2003.02.27
申请号 DE2002131426 申请日期 2002.07.11
申请人 JEOL LTD., AKISHIMA 发明人 HOSOKAWA, FUMIO
分类号 G01N23/04;G21K7/00;H01J37/153;(IPC1-7):H01J37/153;H01J37/063;H01J37/28 主分类号 G01N23/04
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