| 摘要 |
A method for detecting a missing or defective power supply pin connection or other defect that results in excessive transient voltages on power supply rails (62,64) of a circuit. The method comprises applying a dc voltage, whose level is substantially independent of transient voltages on the supply voltage rails (62,64), to a sensor logic gate (44) whose output (50) is applied to a latching circuit (46), applying a signal transition to a stimulus logic gate (42) that is connected to the supply voltage rail; and monitoring the output (56) of a latching circuit (46) for a change in state, a change of state indicating a missing or defective power supply pin connection or other such defect. |
