摘要 |
PROBLEM TO BE SOLVED: To provide a quality judging method for a circuit board capable of rapidly judging the hole size defectiveness and inclination defectiveness of the through-hole formed to the circuit board without using master data, and to provide a quality judging device used therein. SOLUTION: The parallel light passed through the through-hole 1a is detected as pixel gathering 7 by a line sensor, and the maximum diameter S, maximum diameter Y and area S of the through-hole 1a are recognized in the pixel gathering 7. On the assumption that the through-hole 1a has a round shape, the diameterϕof the through-hole 1a calculated on the basis of the formula:ϕ=2(S/π)<1/2> , the maximum diameter X and the maximum diameter Y are mutually compared.
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