发明名称 Frequency domain reflection measurement device
摘要 A frequency domain measurement device multi-phase modulates an RF frequency signal with a broadband signal, such as a pseudo random number, to produce an RF spread spectrum signal that encompasses a frequency range of interest. The RF spread spectrum signal is transmitted to a device under test, and a corresponding reflected signal from the device under test is correlated with the RF spread spectrum signal to produce information from which location of and distance to a fault in the device under test may be determined. A FIR filter is used as part of the correlation process to determine magnitude and phase versus frequency over the frequency range of interest for the device under test as well as location of and distance to the fault.
申请公布号 US6525545(B2) 申请公布日期 2003.02.25
申请号 US20010796564 申请日期 2001.02.28
申请人 TEKTRONIX, INC. 发明人 HILL THOMAS C.
分类号 G01R27/04;G01R27/32;(IPC1-7):G01R27/04 主分类号 G01R27/04
代理机构 代理人
主权项
地址