| 摘要 |
PROBLEM TO BE SOLVED: To provide an electron scope, the diameter of which can be decreased even if provided with a light source section to illuminate a site to be observed at the tip of the electron scope or equipped with a high performance imaging device. SOLUTION: The electron scope has a light source section emitting light to illuminate a site to be observed. The electron scope is equipped with an imaging device to image the site to be observed illuminated by the light on the basis of a plurality of pulse signals sent from a processor at the tip thereof. The scope has a direct current voltage generating means generating direct current voltage to drive the light source section and the imaging device, using at least one of the plurality of pulse signals and applying to the light source section and the imaging device near the tip.
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