发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a TFT which has flat surface for a semiconductor film and has a low off-state current value and has suppressed variations, and also to provide an electronic apparatus provided with the same. SOLUTION: A basic insulation film 11 and an amorphous semiconductor film 12 are formed at nearly the same film-forming temperature, and the obtained amorphous semiconductor film is irradiated with a first laser light to be crystallized. To improve the planarity of the semiconductor film, a second laser light is irradiated in vacuum, eliminating fine holes which has been generated by the irradiation of a laser light in a vacuum, and thereby obtaining a high-quality surface for the semiconductor film.</p>
申请公布号 JP2003051446(A) 申请公布日期 2003.02.21
申请号 JP20020156773 申请日期 2002.05.30
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU
分类号 G02F1/1368;G02F1/13;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;H01L51/50;H05B33/10;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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