| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of inspecting a direct radiation image pickup device in which inspections performed by using X-rays are replaced with a simple method while the qualities of the inspections are maintained, and to provide an inspection device used for the method. SOLUTION: This method is used for inspecting a direct radiation image pickup device having a photoelectric conversion element 300 in which an electrode layer 302 for impressing a voltage for reading out converted electric signals on a converting layer 301 which converts radiation into the electric signals. The electrode layer 302 has openings and the photoelectric conversion element 300 is inspected by projecting a near infrared ray upon the electrode layer 302 while a voltage is impressed on the layer 302.
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