| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with which stability in a standby test can be improved. SOLUTION: By inputting a test mode signal to a test mode input terminal 6, a RAM 2 (special cell requiring the measurement of a standby current) of a semiconductor device 1 is set to a standby state through a dedicated test mode circuit 7 (such as an OR 4 inserted to a chip enable signal line 3, for example). Thus, even when switching test modes, an unexpected troublesome state is eliminated and the standby current in an expected state can be measured by simple processing of inputting the signal to the test mode input terminal 6.
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