发明名称 TESTING METHOD OF IMAGE DISPLAY PANEL MEMBER, IMAGE DISPLAY PANEL MEMBER, IMAGE DISPLAY PANEL, DRIVE METHOD OF THE IMAGE DISPLAY PANEL, AND IMAGE DISPLAY
摘要 <p>PROBLEM TO BE SOLVED: To solve the problem of no image being displayed at a panel completion stage, without ICs that are drive circuits for source wiring in a liquid crystal panel, where the drive circuit for gate wiring is formed by a semiconductor device made of polysilicon, and ICs are used for the drive circuit for source wiring. SOLUTION: The testing method of an image display panel member comprises a glass substrate 11, a plurality of gate wires 12 provided on the glass substrate, a plurality of source wires 13a-13c that cross the gate wiring 12 that is provided on the glass substrate in a matrix form, a plurality of pixel drive sections, and a gate drive circuit 16, having a semiconductor device that is integrated on the glass substrate. In the testing method, wires 21a-21c for source inspection are provided on the substrate, and the gate drive circuit 16 and the pixel drive section are drive; at the same time, inspection signals are applied from the wires 21a-21c for source inspection to the source wires 13a-13c.</p>
申请公布号 JP2003050182(A) 申请公布日期 2003.02.21
申请号 JP20010239669 申请日期 2001.08.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HORI SEIICHIRO
分类号 G01M11/00;G02F1/13;G02F1/133;G02F1/1345;G02F1/1368;G09F9/00;G09G3/20;G09G3/36;(IPC1-7):G01M11/00;G02F1/136;G02F1/134 主分类号 G01M11/00
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