发明名称 METHOD OF FORMING THIN FILM BY GROWTH OF ATOMIC LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a thin film by growth of an atom layer, which enables increase in difference in growth speed which depends on crystal orientation, and to eliminate the generation of an abnormal growth and which enables to improve a shape controllability than the conventional method. SOLUTION: A concave part is formed in a substrate 3 by etching, and then the substrate 3 is placed on a susceptor 2 in a vacuum vessel 1 to be heated to a predetermined temperature by a lamp 4. Valves 7 are opened and closed, to supply a material gas alternately from these valves to form a thin film in the concave part of the substrate by growing an atom layer, and a quantum fine wire and a quantum dot are formed.
申请公布号 JP2003051450(A) 申请公布日期 2003.02.21
申请号 JP20020187362 申请日期 2002.06.27
申请人 INST OF PHYSICAL & CHEMICAL RES 发明人 ISSHIKI HIDEO;IWAI SOHACHI;AOYANAGI KATSUNOBU;SUGANO TAKUO
分类号 H01L21/205;H01L21/20;(IPC1-7):H01L21/205 主分类号 H01L21/205
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