Verfahren zur Herstellung integrierter Schaltungen und erzeugte Halbleiterscheibe

摘要

Manufacturing method for electronic circuits (2) integrated monolithically on a semiconductor support (1) on which said electronic circuits (2) are regularly spaced apart by dividing scribing lines (11) and a network of electrical connection lines (12) used for diagnostic purposes in the wafer of semiconductor material on which are provided the integrated electronic circuits (2). In this manner it is possible to simultaneously perform electrical testing of all the circuits present on the same wafer.