发明名称 Polishing system, polishing method, polishing pad, and method of forming polishing pad
摘要 Disclosed is a polishing system used for polishing a surface to be polished of an object to be polished by a polishing pad, which is capable of improving uniformity of the surface to be polished of the object to be polished by positively, accurately adjusting a polishing pressure, and a polishing method using the polishing system. Concretely, the surface to be polished of a wafer as the object to be polished is polished by relatively moving, along a plane, a polishing surface of the rotating polishing pad and the surface to be polished of the wafer in slide-contact with each other, and adjusting a pressing force applied from the polishing pad to the wafer in accordance with a polishing pressure previously set depending on a relative-positional relationship between the polishing surface of the polishing pad and the surface to be polished of the wafer.
申请公布号 US6520835(B1) 申请公布日期 2003.02.18
申请号 US20000702078 申请日期 2000.10.30
申请人 SONY CORPORATION 发明人 SATO SHUZO;OHTORII HIIZU;OHKAWA YASUHARU;OZAWA YUTAKA;KUSANO TAIICHI
分类号 B24B37/04;B24B49/16;(IPC1-7):B24B49/00;B24B51/00 主分类号 B24B37/04
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