发明名称 |
FERROELECTRIC MEMORY DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A ferroelectric memory device is provided to recover ferroelectric deterioration of a capacitor ferroelectric layer by performing a post-treatment process, and to prevent an operation error caused by an increase of contact interfacial resistance of the ferroelectric memory device by avoiding oxidation of an adhesive layer pattern between a capacitor lower electrode and a contact plug. CONSTITUTION: The ferroelectric memory device has a cell capacitor pattern in which the adhesive layer pattern(30), a lower electrode, a ferroelectric layer pattern(50) and an upper electrode(60) are sequentially formed. An oxygen barrier pattern(70) is so formed to cover only the sidewall of the cell capacitor pattern under the interface between the lower electrode and the ferroelectric layer pattern.
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申请公布号 |
KR20030013587(A) |
申请公布日期 |
2003.02.15 |
申请号 |
KR20010047667 |
申请日期 |
2001.08.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, HYEONG GEUN;LEE, GYU MAN;LEE, YONG TAK |
分类号 |
H01L27/105;G11C11/22;H01L21/02;H01L21/8246;H01L27/115;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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