| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device in which malfunction never be caused and operation can be performed with low power consumption by performing a test again and detecting optimum operation conditions for a cell being easy to be defect out of cells passing a test, and a method for testing the same. SOLUTION: This device is provided with a memory cell array provided with memory cells decided as defect and repaired as a consequence of a first test and test cells decided as memory cells being easy to be defect most out of memory cells decided as passing the test and repaired, a test means by which a second test is performed with operation conditions previously set for the test cell, the operation conditions are adjusted for the test cell in accordance with a result of the second test, the second test is performed repeatedly, or the operation conditions adjusted finally are outputted, and a driving means for driving the memory cell array with operation conditions outputted from the test means.
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