发明名称 APPARATUS FOR MEASURING ELECTROMAGNETIC INTERFERENCE BY ANALYZING AND REDUCING ELECTROMAGNETIC WAVE BY COMPONENTS
摘要 PURPOSE: An apparatus for measuring an electromagnetic interference by analyzing and reducing an electromagnetic wave by components are provided to improve the counterplan about the electromagnetic interference by separating a common mode and a differential mode. CONSTITUTION: A selecting switch unit(25) selects a desired mode by a user among four modes, which are an L1 mode for measuring an L1 noise, an L2 mode for detecting an L2, a common mode for detecting each noise of the ground between the L1 and the L2, and a differential mode for detecting each noise between the L1 and the L2. Plural switches of an input mode selection unit(30) are operated so that one of the four modes is operated according to the selection of the selecting switch unit(25). A display unit(24) displays the mode selected in the input mode selection unit(30) so that the user recognizes it. An output unit(34) selects one of the outputs of the input mode select unit(30). A control unit(31) controls the input mode selection unit(30) and the output unit(34) according to the selection of the selecting switch unit(25) and the display unit(24).
申请公布号 KR20030012746(A) 申请公布日期 2003.02.12
申请号 KR20010047168 申请日期 2001.08.04
申请人 EMCIS CO., LTD. 发明人 KIM, CHEOL SU
分类号 G01R29/08;(IPC1-7):G01R29/08 主分类号 G01R29/08
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