发明名称 Solid state imaging pickup device and method for manufacturing the same
摘要 A solid state imaging pickup device with a single-layer electrode structure which eliminates the release area at the terminal part of the charge transfer electrodes by surrounding the charge transfer electrodes with a dummy pattern, or with a pattern formed by connecting the charge transfer electrodes of a certain phase with each other at the outermost periphery. Surrounding the charge transfer electrode improves embedding performance when an insulating film is re-flowed for flattening inter-electrode gaps. This enables formation of a good metal wire or shielding film with no step-cut, thus improving the reliability of a solid state imaging pickup device.
申请公布号 US6518605(B1) 申请公布日期 2003.02.11
申请号 US20010770188 申请日期 2001.01.29
申请人 NEC CORPORATION 发明人 HATANO KEISUKE;FURUMIYA MASAYUKI;KAWASAKI TORU
分类号 H01L29/762;H01L21/339;H01L27/146;H01L27/148;H04N5/335;H04N5/341;H04N5/369;H04N5/372;(IPC1-7):H01L29/768 主分类号 H01L29/762
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