发明名称 Method for manufacturing a semiconductor device having a metal layer floating over a substrate
摘要 A method for manufacturing a semiconductor device where a passive element, such as, an inductor, is floating over a substrate, where an integrated circuit is formed, such that the overall area of the semiconductor device may be highly reduced. According to the present invention, a first metal layer is formed on the substrate, a first masking layer is formed on a portion of the first metal layer, a second metal layer is formed on other portion of the first metal layer on which the first masking layer is not formed, and a second masking layer is formed on the first masking layer and the second metal layer. Then, the first masking layer and a portion of the second masking layer which includes a portion which covers the first masking layer is removed, a third metal layer is formed on portions of the first and second metal layers which are exposed by the step of removing the first masking layer and the portion of the second masking layer. Finally, the second masking layer, the second metal layer; and the first metal layer except a portion which the third metal layer covers are removed. In this way, the area for integrating various passive elements can be saved and the overall area for the semiconductor device including the integrated circuit and the passive elements may be reduced.
申请公布号 US6518165(B1) 申请公布日期 2003.02.11
申请号 US20010763401 申请日期 2001.02.22
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 YOON JUN BO;HAN CHUL HI;YOON EUI SIK;KIM CHOONG KI
分类号 H01L27/06;H01L23/522;H01L23/64;(IPC1-7):H01L21/476 主分类号 H01L27/06
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