发明名称 |
Etching and cleaning apparatus |
摘要 |
In a plasma processing apparatus wherein plasma is generated in a vacuum chamber 1 thereby to perform etching to a substrate 8 placed on a substrate electrode 7, a voltage monitoring conductor 11 is provided in the vicinity of the substrate electrode 7, and high-frequency power is supplied to both of the substrate electrode 7 and the voltage monitoring conductor 11. Completion of etching operation is detected by monitoring a self-biasing potential generated in this voltage-monitoring conductor 11.
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申请公布号 |
US6517670(B2) |
申请公布日期 |
2003.02.11 |
申请号 |
US20010903069 |
申请日期 |
2001.07.11 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
OKUMURA TOMOHIRO;IMAI HIROSHI |
分类号 |
H05H1/46;C23C16/44;C23F4/00;H01J37/32;H01L21/00;H01L21/302;H01L21/3065;(IPC1-7):H05H1/00;H02N13/00 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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