发明名称 Method for forming a field effect transistor having increased breakdown voltage
摘要 A method of fabricating bipolar junction transistors particularly suitable for electrostatic discharge protection and high voltage MOSFETs. In accordance with the invention, a mask covers bird's beaks formed between field oxide layers and doped regions of a semiconductor substrate. A silicide layer is then added to the exposed surface of the doped regions. The mask prevents the silicide layer from overlying the bird's beaks, thereby precluding the silicide layer from degrading the breakdown junction voltage of the transistor.
申请公布号 US6518178(B1) 申请公布日期 2003.02.11
申请号 US20000675901 申请日期 2000.09.28
申请人 MICRON TECHNOLOGY, INC. 发明人 MA MANNY
分类号 H01L21/331;H01L27/02;(IPC1-7):H01L21/44 主分类号 H01L21/331
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