发明名称 |
SOI SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: An SOI(Silicon On Insulator) semiconductor substrate and a method for fabricating the same are provided to prevent leakage current and short circuit between different conductive types of diode diffusion regions by extending an isolation layer to a sub silicon substrate having the diode diffusion region. CONSTITUTION: A surface silicon layer(320) is formed by depositing a buried oxide layer(310) on a p-type sub silicon substrate(300). A trench is formed on the surface silicon layer(320). An N-well(340) is formed within the sub silicon substrate(300). An isolation layer(330) is formed on an entire surface of the resultant. A gate is formed on the surface silicon layer(320). A predetermined part of the N well(340) is exposed by forming the first opening portion and the second opening portion penetrating the surface silicon layer(320) and the buried oxide layer(310). A P- diffusion region(360) is formed on the silicon layer(320) of both sides of the gate. The P- diffusion region(360) is formed on the N well(340) of a lower portion of the first opening portion. An N- diffusion region(370) is formed on the N well(340) of a lower portion of the second opening portion. A spacer(380) is formed on both sidewalls of the gate and the first and the second opening portions. A P+ diffusion region(390) is formed within the surface silicon layer(320) and the N well(340). An N+ diffusion region is formed on the N well(340). A silicide layer(410) and a contact wire(420) is formed on the gate, the source/drain, the P+ diffusion region(390), and the N+ diffusion region(400).
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申请公布号 |
KR20030011404(A) |
申请公布日期 |
2003.02.11 |
申请号 |
KR20010046807 |
申请日期 |
2001.08.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JUN;LEE, WON GYU |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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